SECONDARY ION MASS-SPECTROMETRY (SIMS)

被引：2
作者：
STUCK, R
SIFFERT, P
机构：
来源：
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1984年 / 8卷 / 1-2期
关键词：
D O I：
10.1016/0146-3535(84)90070-4
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
收藏
页码：11 / 57
页数：47
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