SECONDARY ION MASS-SPECTROMETRY (SIMS)

被引：2

作者：

STUCK, R

SIFFERT, P

机构：

来源：

PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1984年 / 8卷 / 1-2期

关键词：

D O I：

10.1016/0146-3535(84)90070-4

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：11 / 57

页数：47

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