RELIABILITY ANALYSIS FOR 2-UNIT REDUNDANT SYSTEMS WITH REPAIR TIMES

被引:0
作者
KODAMA, M
DEGUCHI, H
机构
[1] OSAKA UNIV,FAC ENGN,SUITA 565,JAPAN
[2] TOHA SYNTH CHEM ENGN CO,TOKYO 171,JAPAN
来源
ELECTRONICS & COMMUNICATIONS IN JAPAN | 1973年 / 56卷 / 10期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:107 / 115
页数:9
相关论文
共 50 条
[41]   A RELIABILITY PHYSICS MODEL FOR ONE-UNIT AND 2-UNIT STANDBY SYSTEMS WITH SINGLE REPAIR FACILITY [J].
GOPALAN, MN ;
VENKATESWARLU, P .
RELIABILITY ENGINEERING & SYSTEM SAFETY, 1986, 14 (01) :37-49
[42]   PARAMETRIC ANALYSIS OF 2-UNIT REDUNDANT COMPUTER-SYSTEMS WITH CORRECTIVE AND PREVENTIVE MAINTENANCE [J].
LAPRIE, JC ;
COSTES, A ;
LANDRAULT, C .
IEEE TRANSACTIONS ON RELIABILITY, 1981, 30 (02) :139-144
[43]   RELIABILITY-ANALYSIS OF A 2-UNIT COLD STANDBY SYSTEM WITH A REPLACEABLE REPAIR FACILITY [J].
CAO, JH ;
WU, YH .
MICROELECTRONICS AND RELIABILITY, 1989, 29 (02) :145-150
[44]   OPTIMUM PREVENTIVE MAINTENANCE POLICIES FOR A 2-UNIT REDUNDANT SYSTEM WITH REPAIR AND POST-REPAIR [J].
SINHA, SM ;
KAPIL, VS .
MICROELECTRONICS AND RELIABILITY, 1980, 20 (06) :887-890
[45]   BEHAVIOR OF A 2-UNIT STANDBY REDUNDANT SYSTEM WITH IMPERFECT SWITCHING AND DELAYED REPAIR [J].
KUMAR, A ;
AGARWAL, M .
MICROELECTRONICS AND RELIABILITY, 1980, 20 (03) :315-321
[46]   ANALYSIS OF A 2-UNIT REDUNDANT SYSTEM WITH OPTIMUM INTERCHANGEMENT TIME [J].
AGNIHOTRI, RK ;
SATSANGI, SK .
MICROELECTRONICS AND RELIABILITY, 1995, 35 (04) :749-750
[47]   G/G/G 2-UNIT STANDBY REDUNDANT-SYSTEMS [J].
SUBRAMANIAN, R ;
NATARAJAN, R .
MICROELECTRONICS AND RELIABILITY, 1987, 27 (02) :249-261
[48]   STOCHASTIC BEHAVIOR OF 2-UNIT STANDBY REDUNDANT SYSTEMS WITH IMPERFECT SWITCHOVER [J].
NAKAGAWA, T ;
OSAKI, S .
IEEE TRANSACTIONS ON RELIABILITY, 1975, R 24 (02) :143-146
[50]   ANALYSIS OF 2-UNIT STAND-BY REDUNDANT SYSTEM UNDER PARTIAL FAILURE AND PREEMPTIVE REPAIR PRIORITY [J].
GUPTA, SM ;
JAISWAL, NK ;
GOEL, LR .
INTERNATIONAL JOURNAL OF SYSTEMS SCIENCE, 1982, 13 (06) :675-681