RELIABILITY ANALYSIS FOR 2-UNIT REDUNDANT SYSTEMS WITH REPAIR TIMES

被引:0
作者
KODAMA, M
DEGUCHI, H
机构
[1] OSAKA UNIV,FAC ENGN,SUITA 565,JAPAN
[2] TOHA SYNTH CHEM ENGN CO,TOKYO 171,JAPAN
来源
ELECTRONICS & COMMUNICATIONS IN JAPAN | 1973年 / 56卷 / 10期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:107 / 115
页数:9
相关论文
共 50 条
[31]   2-UNIT REDUNDANT SYSTEM [J].
SUBRAMANIAN, R ;
RAVICHANDRAN, N .
MICROELECTRONICS AND RELIABILITY, 1979, 19 (03) :277-278
[32]   RELIABILITY-ANALYSIS OF A 2-UNIT COLD STANDBY REDUNDANT SYSTEM WITH 2 OPERATING MODES [J].
GUPTA, SM ;
JAISWAL, NK ;
GOEL, LR .
MICROELECTRONICS AND RELIABILITY, 1982, 22 (04) :747-758
[33]   ANALYSIS OF A 2-UNIT PARALLEL REDUNDANT SYSTEM WITH PHASE TYPE FAILURE AND GENERAL REPAIR [J].
RAVICHANDRAN, N .
MICROELECTRONICS AND RELIABILITY, 1981, 21 (04) :569-572
[34]   STOCHASTIC BEHAVIOR OF A 2-UNIT PRIORITY STANDBY REDUNDANT SYSTEM WITH REPAIR [J].
NAKAGAWA, T ;
OSAKI, S .
MICROELECTRONICS AND RELIABILITY, 1975, 14 (03) :309-313
[35]   PROBABILISTIC ANALYSIS OF A 2-UNIT PARALLEL REDUNDANT SYSTEM [J].
SUBRAMANIAN, R ;
RAVICHANDRAN, N .
MICROELECTRONICS AND RELIABILITY, 1979, 19 (04) :321-323
[36]   A 2-UNIT REDUNDANT SYSTEM WITH DIFFERENT TYPES OF FAILURE AND IMPERFECT REPAIR [J].
SUBRAMANIAN, R ;
NATARAJAN, R .
MICROELECTRONICS AND RELIABILITY, 1990, 30 (04) :697-699
[37]   RELIABILITY-ANALYSIS AND OPTIMIZATION APPLICATIONS OF A 2-UNIT STANDBY REDUNDANT SYSTEM WITH SPARE UNITS [J].
AGRAFIOTIS, GK ;
TSOUKALAS, MZ .
MICROELECTRONICS AND RELIABILITY, 1994, 34 (09) :1469-1475
[38]   ON A 2-UNIT STANDBY REDUNDANT SYSTEM SUBJECT TO REPAIR AND PREVENTIVE MAINTENANCE [J].
MOKADDIS, GS ;
ELIAS, SS ;
LABIB, SW .
MICROELECTRONICS AND RELIABILITY, 1987, 27 (04) :661-675
[39]   2-UNIT REDUNDANT SYSTEM WITH RANDOM SWITCHOVER TIME AND 2 TYPES OF REPAIR [J].
SINGH, SP ;
KAPUR, PK ;
KAPOOR, KR .
MICROELECTRONICS AND RELIABILITY, 1979, 19 (04) :325-328
[40]   ANALYSIS OF RELIABILITY BOUNDS FOR 2-UNIT PARALLEL AND STANDBY REPAIRABLE SYSTEMS [J].
GUPTA, R ;
CHAUDHARY, A .
MICROELECTRONICS AND RELIABILITY, 1995, 35 (01) :113-115