SOFT-ERROR FILTERING - A SOLUTION TO THE RELIABILITY PROBLEM OF FUTURE VLSI DIGITAL CIRCUITS

被引：12

作者：

SAVARIA, Y ^{[1
]}

RUMIN, NC ^{[1
]}

HAYES, JF ^{[1
]}

AGARWAL, VK ^{[1
]}

机构：

[1] MCGILL UNIV,DEPT ELECT ENGN,MONTREAL H3A 2A7,QUEBEC,CANADA

来源：

关键词：

D O I：

10.1109/PROC.1986.13530

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：669 / 683

页数：15

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[3]

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[4]

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[5]

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[6]

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[7]

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[8]

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[9]

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MCELIECE, RJ .