SOFT-ERROR FILTERING - A SOLUTION TO THE RELIABILITY PROBLEM OF FUTURE VLSI DIGITAL CIRCUITS

被引：12
|
作者：
SAVARIA, Y [1 ]
RUMIN, NC [1 ]
HAYES, JF [1 ]
AGARWAL, VK [1 ]
机构：
[1] MCGILL UNIV,DEPT ELECT ENGN,MONTREAL H3A 2A7,QUEBEC,CANADA
来源：
PROCEEDINGS OF THE IEEE | 1986年 / 74卷 / 05期
关键词：
D O I：
10.1109/PROC.1986.13530
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
22
引用
收藏
页码：669 / 683
页数：15
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