IMAGING PRACTICAL SURFACES IN A FIELD-ION MICROSCOPE

被引：0

作者：

VIJENDRAN, P ^{[1
]}

RAMANATHAN, D ^{[1
]}

DASS, S ^{[1
]}

机构：

[1] BHABHA ATOM RES CTR,DIV TECH PHYS,BOMBAY 400085,INDIA

来源：

NATURE | 1977年 / 269卷 / 5625期

关键词：

D O I：

10.1038/269232a0

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：232 / 234

页数：3

共 50 条

[31] OBSERVATION OF SI IN FIELD-ION MICROSCOPE
ISHII, S
MANABE, S
HANAWA, T
JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, : 63 - 66
[32] FIELD PENETRATION INTO SEMICONDUCTORS IN THE FIELD-ION MICROSCOPE
ERNST, L
SURFACE SCIENCE, 1979, 85 (02) : 302 - 308
[33] OBSERVATION OF SI IN FIELD-ION MICROSCOPE
BLOCK, JH
ERNST, L
ERNST, N
JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 (11) : 1813 - 1814
[34] CONSTRUCTION AND OPERATION OF A FIELD-ION MICROSCOPE
SINGH, SC
RANGANATHAN, S
PRABHAWALKAR, PD
CHANDRASEKHARAIAH, MN
INDIAN JOURNAL OF TECHNOLOGY, 1972, 10 (01): : 29 - +
[35] A FIELD-ION MICROSCOPE IMAGING ATOM PROBE FOR INSITU SURFACE STUDIES
DONE, S
WALLS, JM
INSTITUTE OF PHYSICS CONFERENCE SERIES, 1983, (68): : 495 - 498
[36] FIELD-ION MICROSCOPE, IMAGING ATOM PROBE STUDY OF METALLIC GLASSES
ELSWIJK, HB
BRONSVELD, PM
DEHOSSON, JTM
JOURNAL DE PHYSIQUE, 1987, 48 (C-6): : 305 - 310
[37] IMAGING CHARACTERISTICS OF TI-3AL IN FIELD-ION MICROSCOPE
CHOUDHARY, RK
RANGANATHAN, S
INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1976, 14 (05) : 341 - 344
[38] IMAGING GAS CONCENTRATION IN THE FIELD-ION MICROSCOPE - A THEORETICAL-ANALYSIS
DECASTILHO, CMC
KINGHAM, DR
SURFACE SCIENCE, 1988, 204 (03) : 568 - 586
[39] OXIDATION OF CLEAN RUTHENIUM SURFACES .1. FIELD-ION MICROSCOPE STUDIES
CRANSTOUN, GKL
PYKE, DR
APPLIED SURFACE SCIENCE, 1979, 2 (03) : 359 - 374
[40] ATOMIC STRUCTURES OF SEVERAL SILICON SURFACES - A DIRECT FIELD-ION MICROSCOPE OBSERVATION
LIU, HM
TSONG, TT
JOURNAL OF APPLIED PHYSICS, 1987, 62 (04) : 1532 - 1534

← 1 2 3 4 5 →