SECONDARY-ELECTRON BACKGROUND PROBLEM IN ELECTRON EXCITED AUGER-ELECTRON SPECTROSCOPY

被引：4
作者：
HOUSTON, JE [1 ]
机构：
[1] SANDIA LABS,ALBUQUERQUE,NM 87115
来源：
APPLIED PHYSICS | 1975年 / 6卷 / 02期
关键词：
D O I：
10.1007/BF00883765
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：281 / 282
页数：2
相关论文
共 8 条
[1]   FINE STRUCTURES AND ENERGY-DISTRIBUTION OF SECONDARY ELECTRON EMISSION FROM SI(111) [J].
GOTO, K ;
ISHIKAWA, K .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (01) :132-137
[2]   QUANTITATIVE AUGER ANALYSIS USING INTEGRATION TECHNIQUES [J].
GRANT, JT ;
HAAS, TW ;
HOUSTON, JE .
PHYSICS LETTERS A, 1973, A 45 (04) :309-310
[3]  
HOUSTON JB, IN PRESS
[4]  
HOUSTON JE, 1974, REV SCI INSTRUM, V45, P897, DOI 10.1063/1.1686763
[5]   RETRIEVAL OF ELECTRON-EXCITED AUGER STRUCTURE BY DYNAMIC BACKGROUND SUBTRACTION [J].
HOUSTON, JE .
APPLIED PHYSICS LETTERS, 1974, 24 (01) :42-44
[6]   EXACT CORRECTIONS FOR POTENTIAL MODULATION DISTORTION IN AUGER YIELD MEASUREMENTS [J].
HOUSTON, JE .
SURFACE SCIENCE, 1973, 38 (02) :283-291
[7]   SECONDARY EMISSION ANALOG FOR IMPROVED AUGER SPECTROSCOPY WITH RETARDING POTENTIAL ANALYZERS [J].
SICKAFUS, EN .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (07) :933-&
[8]   ABSOLUTE ATOMIC DENSITIES DETERMINED BY AUGER-ELECTRON SPECTROSCOPY [J].
STAIB, P ;
KIRSCHNER, J .
APPLIED PHYSICS, 1974, 3 (05) :421-427
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