RAPID MEASUREMENT OF STATIC AND DYNAMIC SURFACE FORCES

被引：29

作者：

DUCKER, WA

COOK, RF

机构：

[1] IBM Research Division, T. J. Watson Research Center, Yorktown Heights, NY 10598

来源：

APPLIED PHYSICS LETTERS | 1990年 / 56卷 / 24期

关键词：

D O I：

10.1063/1.102893

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present a technique for rapid measurement of surface forces using an ac force microscope. Measurement of both the amplitude and relative phase of a cantilever probe allows simultaneous and rapid determination of static and velocity-dependent forces of order nN over nm length scales. Using this technique, we have also demonstrated the high lateral spatial resolution of the force microscope in the measurement of surface forces.

引用

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页码：2408 / 2410

页数：3

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