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2-LAYER MICROWAVE FET STRUCTURE FOR IMPROVED CHARACTERISTICS
被引:16
作者
:
DAS, MB
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,DEPT ELECT ENGN,UNIVERSITY PK,PA 16802
PENN STATE UNIV,DEPT ELECT ENGN,UNIVERSITY PK,PA 16802
DAS, MB
[
1
]
ESQUEDA, P
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,DEPT ELECT ENGN,UNIVERSITY PK,PA 16802
PENN STATE UNIV,DEPT ELECT ENGN,UNIVERSITY PK,PA 16802
ESQUEDA, P
[
1
]
机构
:
[1]
PENN STATE UNIV,DEPT ELECT ENGN,UNIVERSITY PK,PA 16802
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1977年
/ 24卷
/ 06期
关键词
:
D O I
:
10.1109/T-ED.1977.18817
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:757 / 761
页数:5
相关论文
共 3 条
[1]
BOOTHROYD AR, 1963, IEEE T ELECTRON DEV, VED10, P149
[2]
CARRIER MOBILITIES IN SILICON EMPIRICALLY RELATED TO DOPING AND FIELD
CAUGHEY, DM
论文数:
0
引用数:
0
h-index:
0
CAUGHEY, DM
THOMAS, RE
论文数:
0
引用数:
0
h-index:
0
THOMAS, RE
[J].
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,
1967,
55
(12):
: 2192
-
+
[3]
SIMPLIFIED COMPUTER-AIDED ANALYSIS OF DOUBLE-DIFFUSED TRANSISTORS INCLUDING 2-DIMENSIONAL HIGH-LEVEL EFFECTS
ROULSTON, DJ
论文数:
0
引用数:
0
h-index:
0
ROULSTON, DJ
SEHGAL, J
论文数:
0
引用数:
0
h-index:
0
SEHGAL, J
CHAMBERL.SG
论文数:
0
引用数:
0
h-index:
0
CHAMBERL.SG
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(06)
: 809
-
&
←
1
→
共 3 条
[1]
BOOTHROYD AR, 1963, IEEE T ELECTRON DEV, VED10, P149
[2]
CARRIER MOBILITIES IN SILICON EMPIRICALLY RELATED TO DOPING AND FIELD
CAUGHEY, DM
论文数:
0
引用数:
0
h-index:
0
CAUGHEY, DM
THOMAS, RE
论文数:
0
引用数:
0
h-index:
0
THOMAS, RE
[J].
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,
1967,
55
(12):
: 2192
-
+
[3]
SIMPLIFIED COMPUTER-AIDED ANALYSIS OF DOUBLE-DIFFUSED TRANSISTORS INCLUDING 2-DIMENSIONAL HIGH-LEVEL EFFECTS
ROULSTON, DJ
论文数:
0
引用数:
0
h-index:
0
ROULSTON, DJ
SEHGAL, J
论文数:
0
引用数:
0
h-index:
0
SEHGAL, J
CHAMBERL.SG
论文数:
0
引用数:
0
h-index:
0
CHAMBERL.SG
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(06)
: 809
-
&
←
1
→