MEASUREMENT OF THE ELECTROTHERMAL NONLINEARITY AND THERMAL RELAXATION-TIMES OF THIN METAL-FILMS

被引：0

作者：

PHAN, HK

NGUYEN, TH

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1983年 / 77卷 / 02期

关键词：

D O I：

10.1002/pssa.2210770260

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：K135 / K138

页数：4

相关论文

共 50 条

[11] LUBRICATION WITH THIN METAL-FILMS
KUWAHARA, K
[J]. JOURNAL OF JAPAN SOCIETY OF LUBRICATION ENGINEERS, 1974, 19 (10): : 745 - 748
[12] RESISTIVITY OF THIN METAL-FILMS
CHAURASIA, HK
VOSS, WAG
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1973, MT21 (01) : 51 - 52
[13] INTERDIFFUSION OF THIN METAL-FILMS
BAGLIN, JEE
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (03) : C77 - C77
[14] OPTICS OF THIN METAL-FILMS
JUENKER, DW
[J]. AMERICAN JOURNAL OF PHYSICS, 1972, 40 (02) : 358 - &
[15] PRECIPITATION OF THIN METAL-FILMS
VICENTE, VA
[J]. UMSCHAU IN WISSENSCHAFT UND TECHNIK, 1978, 78 (23) : 737 - 737
[16] QUASIPARTICLE RELAXATION-TIMES IN CLEAN AL FILMS
MOODY, MV
PATERSON, JL
[J]. PHYSICAL REVIEW B, 1981, 23 (01) : 133 - 142
[17] QUASIPARTICLE RELAXATION-TIMES IN CLEAN AL FILMS
MOODY, MV
PATERSON, JL
[J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1980, 25 (03): : 412 - 413
[18] INSITU MEASUREMENT IS A MUST FOR SIZE EFFECT STUDIES OF THIN METAL-FILMS
SEN, P
[J]. CURRENT SCIENCE, 1977, 46 (24): : 848 - 849
[19] ADHESION MEASUREMENT OF THIN METAL-FILMS BY SCRATCH, PEEL, AND PULL METHODS
KINBARA, A
KONDO, I
[J]. JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 1993, 7 (08) : 767 - 782
[20] EVAPORATIVE THIN METAL-FILMS AS POLARIZERS
SLOCUM, RE
[J]. PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1981, 307 : 25 - 30

← 1 2 3 4 5 →