THE APPLICATION OF LASER IONIZATION MASS-SPECTROMETRY TO THE STUDY OF THIN-FILMS AND NEAR-SURFACE LAYERS

被引：7

作者：

CLARKE, NS

RUCKMAN, JC

DAVEY, AR

机构：

[1] AWRE Aldermaston, Reading, Engl, AWRE Aldermaston, Reading, Engl

来源：

关键词：

LAMMA (LASER MICROPROBE MASS ANALYZER) - LASER IONIZATION MASS SPECTROMETRY - LIMA (LASER IONIZATION MASS ANALYZER) - NEAR-SURFACE LAYERS;

D O I：

10.1002/sia.740090107

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

(Edited Abstract)

引用

页码：31 / 40

页数：10

共 31 条

[1]

ABECK W, 1969, GEVAERT AGFA NV JUN, P759

[2]

ABECK W, 1969, GEVAERT AGFA, P725

[3]

ANDERSON FW, 1984, MICROBEAM ANAL, P325

[4]

ANTONY SR, COMMUNICATION

[5]

BAUDISCH O, 1932, J AM CHEM SOC, V54, P943

[6]

Clarke N. M., UNPUB

[7]

CLARKE NS, 1984, 32ND P UKAEA C MAT A

[8]

COTTER RJ, 1984, ANAL CHEM, V56, P485

[9] LIMA - A LASER-INDUCED ION MASS ANALYZER [J].

DINGLE, T ;

GRIFFITHS, BW ;

RUCKMAN, JC .

[10]

DINGLE T, 1985, MICROBEAM ANAL 1985, P315