CRYSTALLOGRAPHIC CHARACTERIZATION OF SOME INTERMETALLIC COMPOUNDS IN THE AL-CR SYSTEM

被引:39
作者
BENDERSKY, LA
ROTH, RS
RAMON, JT
SHECHTMAN, D
机构
[1] NATL INST STAND & TECHNOL,INST MAT SCI & ENGN,DIV CERAM,GAITHERSBURG,MD 20899
[2] TECHNION ISRAEL INST TECHNOL,DEPT MAT ENGN,HAIFA,ISRAEL
来源
METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE | 1991年 / 22卷 / 01期
关键词
D O I
10.1007/BF03350943
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Two Al-Cr compounds, known in the literature as the eta and epsilon phases, were studied by precession camera single crystal X-ray diffraction and transmission electron microscopy (TEM). The results are different from those reported in the literature. The epsilon Al4Cr phase was found to be hexagonal P6(3)/mmc, with lattice parameters a = 2.01 nm and c = 2.48 nm, and we suggest that it is isomorphous to the Al4Mn mu phase. The eta Al11Cr2 phase has a monoclinic (pseudo-orthorhombic) C-centered Bravais lattice with a3 congruent-to 1.76 nm, b3 congruent-to 3.05 nm, c3 congruent-to 1.76 nm, and beta congruent-to 90 deg and a possible C2/c space group. Single crystals of the eta phase are usually twinned.
引用
收藏
页码:5 / 10
页数:6
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