MEASUREMENT OF THE MINORITY-CARRIER DIFFUSION LENGTH IN THIN SEMICONDUCTOR-FILMS

被引：0

作者：

CHIANG, CL ^{[1
]}

SCHWARZ, R ^{[1
]}

SLOBODIN, DE ^{[1
]}

KOLODZEY, J ^{[1
]}

WAGNER, S ^{[1
]}

机构：

[1] PRINCETON UNIV,DEPT ELECT ENGN & COMP SCI,ELECTR MAT & DEVICES GRP,PRINCETON,NJ 08544

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1986年 / 33卷 / 10期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1587 / 1592

页数：6

共 50 条

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