STATIC CHARACTERISTICS OF METAL-INSULATOR-SEMICONDUCTOR-INSULATOR-METAL (MISIM) STRUCTURE .2. LOW-FREQUENCY CAPACITANCE

被引:4
|
作者
DJURIC, Z
SMILJANIC, M
TJAPKIN, D
机构
[1] INST CHEM TECHNOL & MET, NJEGOSEVA 12, 11000 BELGRADE, YUGOSLAVIA
[2] INST PHYS, POB 57, 11000 BELGRADE, YUGOSLAVIA
[3] FAC ELECT ENGN, 11000 BELGRADE, YUGOSLAVIA
关键词
D O I
10.1016/0038-1101(75)90002-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:827 / 831
页数:5
相关论文
共 50 条
  • [21] MEMORY OF THE ACTION OF A LIGHT PULSE STORED IN A METAL-INSULATOR-SEMICONDUCTOR-INSULATOR-METAL STRUCTURE OPERATING IN THE PRE-BREAKDOWN REGION.
    Kovtonyuk, N.F.
    Morozov, V.A.
    Radin, V.G.
    Bogomolov, P.A.
    Alisultanov, Yu.B.
    Potapov, I.S.
    1972, 6 (03): : 503 - 504
  • [22] Current and capacitance characteristics of a metal-insulator-semiconductor structure with an ultrathin oxide layer
    Fu, Y
    Willander, M
    Lundgren, P
    SUPERLATTICES AND MICROSTRUCTURES, 2001, 30 (02) : 53 - 60
  • [23] Improving the Accuracy in Determining the Insulator Capacitance in Metal–Insulator–Semiconductor Structures
    A. G. Zhdan
    N. F. Kukharskaya
    G. V. Chucheva
    Instruments and Experimental Techniques, 2004, 47 : 791 - 798
  • [24] Electrical characteristics of metal-insulator-semiconductor and metal-insulator-semiconductor-insulator-metal capacitors under different high-k gate dielectrics investigated in the semi-classical and quantum mechanical models
    Hlali, Slah
    Hizem, Neila
    Kalboussi, Adel
    BULLETIN OF MATERIALS SCIENCE, 2017, 40 (01) : 67 - 78
  • [25] Characteristics of GaN Metal-Insulator-Semiconductor-Insulator-Metal Ultraviolet Photodiodes Using Al2O3, HfO2, and ZrO2 as Insulators
    Seol, Jeong-Hoon
    Lee, Gil-Ho
    Hahm, Sung-Ho
    IEEE SENSORS JOURNAL, 2018, 18 (11) : 4477 - 4481
  • [26] NONLINEAR PROPERTIES OF THE CAPACITANCE OF AN ILLUMINATED METAL-INSULATOR SEMICONDUCTOR STRUCTURE
    ZHMUROV, SE
    MARCHENKO, VF
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1986, 20 (05): : 578 - 579
  • [27] Improving the accuracy in determining the insulator capacitance in metal-insulator-semiconductor structures
    Zhdan, AG
    Kukharskaya, NF
    Chucheva, GV
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2004, 47 (06) : 791 - 798
  • [28] On the Capacitance of Piezoelectric Metal-Insulator-Semiconductor Junctions
    Yang, Lei
    Du, Jianke
    Wang, Ji
    Yang, Jiashi
    FERROELECTRICS LETTERS SECTION, 2021, 48 (1-3) : 1 - 12
  • [29] Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors
    Giusi, G.
    Saini, Nishant
    Croes, K.
    Ciofi, I.
    Scandurra, G.
    Ciofi, C.
    Tierno, D.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2025, 72 (04) : 1933 - 1938
  • [30] Capacitance and conductance characteristics of silicon nanocrystal metal-insulator-semiconductor devices
    Flynn, C.
    Koenig, D.
    Perez-Wurfl, I.
    Conibeer, G.
    Green, M. A.
    SOLID-STATE ELECTRONICS, 2009, 53 (05) : 530 - 539