On Record Values and Reliability Properties of Marshall-Olkin Extended Exponential Distribution

被引：0

作者：

Jose, K. K. ^{[1
]}

Krishna, E. ^{[2
]}

Ristic, Miroslav M. ^{[3
]}

机构：

[1] Cent Univ Rajasthan, Dept Stat, Rajasthan 305802, India

[2] St Josephs Coll Women, Dept Stat, Alappuzha 688001, Kerala, India

[3] Univ Nis, Fac Sci & Math, Nish 1800, Serbia

来源：

JOURNAL OF STATISTICAL THEORY AND APPLICATIONS | 2014年 / 13卷 / 03期

关键词：

Auto regressive processes; Entropy; Exponential distribution; Marshall-Olkin distribution; Record values; Reliability; Sample path; Simulation; Stress-strength analysis;

D O I：

暂无

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

The Marshall-Olkin Extended Exponential distribution is introduced and reliability properties are studied. The p.d.f.'s of n(th) record value, joint p.d.f.'s, of m(th) and n(th) record values are derived to obtain the expression for mean, variance and covariance of reord values. The entropy of j(th) record value is derived. The stress strength analysis for the new model is carried out. We develop autoregressive processes and sample path properties are explored. The results are verified using simulations as well as graphical studies. The model is extended to higher orders also.

引用

页码：247 / 262

页数：16