HIGH-RESOLUTION DOUBLE-CRYSTAL X-RAY-DIFFRACTION FOR IMPROVED ASSESSMENT OF MODULATED SEMICONDUCTOR STRUCTURES

被引：6
作者：
TAPFER, L
STOLZ, W
FISCHER, A
PLOOG, K
机构：
来源：
SURFACE SCIENCE | 1986年 / 174卷 / 1-3期
关键词：
D O I：
10.1016/0039-6028(86)90391-2
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：88 / 93
页数：6
相关论文
共 5 条
[1]   X-RAY-DIFFRACTION STUDY OF INTER-DIFFUSION AND GROWTH IN (GAAS)N(AIAS)M MULTILAYERS [J].
FLEMING, RM ;
MCWHAN, DB ;
GOSSARD, AC ;
WIEGMANN, W ;
LOGAN, RA .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (01) :357-363
[2]   PHOTO-LUMINESCENCE OF AN ALAS-GAAS SUPER-LATTICE GROWN BY MBE IN THE 0.7-0.8-MU-M WAVELENGTH REGION [J].
ISHIBASHI, T ;
SUZUKI, Y ;
OKAMOTO, H .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (09) :L623-L626
[3]  
PETRASHEN PV, 1976, SOV PHYS SOLID STATE, V17, P1882
[4]   X-RAY DIFFRACTION FROM ONE-DIMENSIONAL SUPERLATTICES IN GAAS1-XPX CRYSTALS [J].
SEGMULLER, A ;
BLAKESLEE, AE .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (FEB1) :19-25
[5]   X-RAY ROCKING CURVE ANALYSIS OF SUPERLATTICES [J].
SPERIOSU, VS ;
VREELAND, T .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (06) :1591-1600
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