DISCRETE RESISTANCE SWITCHING IN SUBMICROMETER SILICON INVERSION-LAYERS - INDIVIDUAL INTERFACE TRAPS AND LOW-FREQUENCY (1-F QUESTIONABLE) NOISE

被引：605

作者：

RALLS, KS ^{[1
]}

SKOCPOL, WJ ^{[1
]}

JACKEL, LD ^{[1
]}

HOWARD, RE ^{[1
]}

FETTER, LA ^{[1
]}

EPWORTH, RW ^{[1
]}

TENNANT, DM ^{[1
]}

机构：

[1] BELL TEL LABS INC, HOLMDEL, NJ 07733 USA

来源：

PHYSICAL REVIEW LETTERS | 1984年 / 52卷 / 03期

关键词：

D O I：

10.1103/PhysRevLett.52.228

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：228 / 231

页数：4

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