A COMPLEX 2-UNIT SYSTEM WITH RANDOM BREAKDOWN OF REPAIR FACILITY

被引:20
作者
GURURAJAN, M
SRINIVASAN, B
机构
[1] Department of Statistics, Madras Christian College, Tambaram, Madras
来源
MICROELECTRONICS AND RELIABILITY | 1995年 / 35卷 / 02期
关键词
Reliability theory;
D O I
10.1016/0026-2714(94)00048-S
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper deals with a two-unit warm standby system with a single repair facility. The lifetime of the functioning (online) unit has a general distribution, while the standby unit has a phase-type distribution. The repair facility is subjected to random breakdown and is restored after a random time. The statistical characteristics, such as reliability, availability and interval reliability, are provided for the model.
引用
收藏
页码:299 / 302
页数:4
相关论文
共 4 条
[1]   ON THE APPLICATIONS OF PHASE TYPE DISTRIBUTION TO A COMPLEX 2-UNIT STANDBY REDUNDANT SYSTEM [J].
GURURAJAN, M ;
NATARAJAN, R ;
CHANDRASEKHAR, P .
MICROELECTRONICS RELIABILITY, 1986, 26 (03) :443-446
[2]  
NEUTES MF, 1965, PROBABILITY DISTRIBU, P173
[3]  
Neuts M. F., 1981, OR Spektrum, V2, P227, DOI 10.1007/BF01721011
[4]  
SRINIVASAN SK, 1980, LECTURE NOTES EC MAT, V175