USING PROBABILITIES IN ANALYZING TWO-DIMENSIONAL SPATIAL PATTERNS

[1] CHOYNOWSKI M, 1959, J AM STAT ASSOC, V54, P385

[2] INTRODUCING DEPENDENCY INTO IC YIELD MODELS [J]. SOLID-STATE ELECTRONICS, 1985, 28 (06) : 555 - 559

[3] MOORE GE, 1970, ELECTRONICS, V43, P126

[4] MODIFICATION OF POISSON STATISTICS - MODELING DEFECTS INDUCED BY DIFFUSION [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1977, 12 (05) : 540 - 546

[5] COMPOSITE MODEL TO IC YIELD PROBLEM [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1975, 10 (06) : 537 - 539

[6] A SIMPLE METHOD FOR MODELING VLSI YIELDS [J]. SOLID-STATE ELECTRONICS, 1982, 25 (06) : 487 - 489

[1] CHOYNOWSKI M, 1959, J AM STAT ASSOC, V54, P385

[2] INTRODUCING DEPENDENCY INTO IC YIELD MODELS [J]. SOLID-STATE ELECTRONICS, 1985, 28 (06) : 555 - 559

[3] MOORE GE, 1970, ELECTRONICS, V43, P126

[4] MODIFICATION OF POISSON STATISTICS - MODELING DEFECTS INDUCED BY DIFFUSION [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1977, 12 (05) : 540 - 546

[5] COMPOSITE MODEL TO IC YIELD PROBLEM [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1975, 10 (06) : 537 - 539

[6] A SIMPLE METHOD FOR MODELING VLSI YIELDS [J]. SOLID-STATE ELECTRONICS, 1982, 25 (06) : 487 - 489