AVALANCHE BREAKDOWN IN READ DIODES AND PIN DIODES

被引:25
作者
GIBBONS, G
SZE, SM
机构
关键词
D O I
10.1016/0038-1101(68)90083-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:225 / +
页数:1
相关论文
共 13 条
[1]   TEMPERATURE DEPENDENCE OF AVALANCHE MULTIPLICATION IN SEMICONDUCTORS [J].
CROWELL, CR ;
SZE, SM .
APPLIED PHYSICS LETTERS, 1966, 9 (06) :242-&
[2]  
DELOACH BC, ADVANCES MICROWAVES
[3]  
GUMMEL H, TO BE PUBLISHED
[4]   IONIZATION RATES OF HOLES + ELECTRONS IN SILICON [J].
LEE, CA ;
KLEIMACK, JJ ;
BATDORF, RL ;
WIEGMANN, W ;
LOGAN, RA .
PHYSICAL REVIEW, 1964, 134 (3A) :A761-+
[5]   AVALANCHE BREAKDOWN IN GERMANIUM [J].
MILLER, SL .
PHYSICAL REVIEW, 1955, 99 (04) :1234-1241
[7]  
MISAWA T, 1966, IEEE T ELECTRON DEV, VED13, P143, DOI 10.1109/T-ED.1966.15648
[8]  
MOLL JL, 1964, PHYSICS SEMICONDUCTO
[9]   A PROPOSED HIGH-FREQUENCY, NEGATIVE-RESISTANCE DIODE [J].
READ, WT .
BELL SYSTEM TECHNICAL JOURNAL, 1958, 37 (02) :401-446
[10]   EFFECT OF JUNCTION CURVATURE ON BREAKDOWN VOLTAGE IN SEMICONDUCTORS [J].
SZE, SM ;
GIBBONS, G .
SOLID-STATE ELECTRONICS, 1966, 9 (09) :831-&