METASTABILITY OF CMOS MASTER SLAVE FLIP-FLOPS

被引：17

作者：

GABARA, TJ ^{[1
]}

CYR, GJ ^{[1
]}

STROUD, CE ^{[1
]}

机构：

[1] AT&T BELL LABS,NAPERVILLE,IL 60566

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING | 1992年 / 39卷 / 10期

关键词：

D O I：

10.1109/82.199899

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents circuit techniques used to improve the mean time between failures (MTBF) of a latch due to metastable events. The complete approach includes a unique design of the latch and the formation of series connected master/slave (M/S) flip-flops using this latch. An equation is developed to predict the MTBF due to metastability of a single latch and is extended to include single and multiple series connected M/S flip-flops. The equation predicts that the MTBF increases significantly by using such a M/S flip-flop configuration.

引用

页码：734 / 740

页数：7

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