SPATIAL FRINGE SCANNING FOR OPTICAL-PHASE MEASUREMENT

被引:38
作者
TOYOOKA, S
TOMINAGA, M
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D O I
10.1016/0030-4018(84)90152-4
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
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页码:68 / 70
页数:3
相关论文
共 3 条
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BRUNING JH, 1978, OPTICAL SHOP TESTING, P414
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APPLIED OPTICS, 1979, 18 (11) :1797-1803
[3]   FOURIER-TRANSFORM METHOD OF FRINGE-PATTERN ANALYSIS FOR COMPUTER-BASED TOPOGRAPHY AND INTERFEROMETRY [J].
TAKEDA, M ;
INA, H ;
KOBAYASHI, S .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (01) :156-160