POINT-DEFECT STRUCTURES AND ENERGETICS IN SI USING AN EMPIRICAL POTENTIAL

被引:7
作者
UNGAR, PJ [1 ]
TAKAI, T [1 ]
HALICIOGLU, T [1 ]
TILLER, WA [1 ]
机构
[1] STANFORD UNIV,DEPT MAT SCI & ENGN,STANFORD,CA 94305
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1993年 / 11卷 / 01期
关键词
D O I
10.1116/1.578707
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Statics calculations on silicon using the Tersoff 2 and Tersoff 3 potential energy functions are presented. We have evaluated the following at 0 K: (1) neutral monovacancy and divacancy formation and migration energies; (2) neutral bond-centered, site sharing, tetrahedral, and hexagonal self-interstitial formation and migration energies; and (3) the variation of these energies with distance from a bulk site of Frenkel defect formation and from [100] and [111] surfaces. The structural variations around these defects are also determined and discussed.
引用
收藏
页码:224 / 230
页数:7
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