ACCURATE 2ND-ORDER SUSCEPTIBILITY MEASUREMENTS OF VISIBLE AND INFRARED NONLINEAR CRYSTALS

被引：244

作者：

CHOY, MM ^{[1
]}

BYER, RL ^{[1
]}

机构：

[1] STANFORD UNIV, WW HANSEN LABS PHYS, DEPT APPL PHYS, MICROWAVE LAB, STANFORD, CA 94305 USA

来源：

PHYSICAL REVIEW B | 1976年 / 14卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.14.1693

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：1693 / 1706

页数：14

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[4] Bevington P., 1969, DATA REDUCTION ERROR
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