On the Tapping Mode Measurement for Young's Modulus of Nanocrystalline Metal Coatings
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作者:
Ahmed, H. S. Tanvir
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Texas Tech Univ, Mech Engn, Edward E Whitacre Jr Coll Engn, POB 41021, Lubbock, TX 79409 USATexas Tech Univ, Mech Engn, Edward E Whitacre Jr Coll Engn, POB 41021, Lubbock, TX 79409 USA
Ahmed, H. S. Tanvir
[1
]
Brannigan, Eric
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Texas Tech Univ, Mech Engn, Edward E Whitacre Jr Coll Engn, POB 41021, Lubbock, TX 79409 USATexas Tech Univ, Mech Engn, Edward E Whitacre Jr Coll Engn, POB 41021, Lubbock, TX 79409 USA
Brannigan, Eric
[1
]
Jankowski, Alan F.
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Texas Tech Univ, Mech Engn, Edward E Whitacre Jr Coll Engn, POB 41021, Lubbock, TX 79409 USATexas Tech Univ, Mech Engn, Edward E Whitacre Jr Coll Engn, POB 41021, Lubbock, TX 79409 USA
Jankowski, Alan F.
[1
]
机构:
[1] Texas Tech Univ, Mech Engn, Edward E Whitacre Jr Coll Engn, POB 41021, Lubbock, TX 79409 USA
Young's modulus of nanocrystalline metal coatings is measured using the oscillating, that is, tapping, mode of a cantilever with a diamond tip. The resonant frequency of the cantilever changes when the diamond tip comes in contact with a sample surface. A Hertz-contact-based model is further developed using higher-order terms in a Taylor series expansion to determine a relationship between the reduced elastic modulus and the shift in the resonant frequency of the cantilever during elastic contact between the diamond tip and sample surface. The tapping mode technique can be used to accurately determine Young's modulus that corresponds with the crystalline orientation of the sample surface as demonstrated for nanocrystalline nickel, vanadium, and tantalum coatings.
机构:
Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R China
Chen, J
;
Lu, L
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Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R China
Lu, L
;
Lu, K
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Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R China
机构:
IBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Doerner, M. F.
;
Nix, W. D.
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Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA
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Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R China
Chen, J
;
Lu, L
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Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R China
Lu, L
;
Lu, K
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Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, SYNL, Shenyang 110016, Peoples R China
机构:
IBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Doerner, M. F.
;
Nix, W. D.
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Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA