On the Tapping Mode Measurement for Young's Modulus of Nanocrystalline Metal Coatings

被引:2
作者
Ahmed, H. S. Tanvir [1 ]
Brannigan, Eric [1 ]
Jankowski, Alan F. [1 ]
机构
[1] Texas Tech Univ, Mech Engn, Edward E Whitacre Jr Coll Engn, POB 41021, Lubbock, TX 79409 USA
关键词
D O I
10.1155/2013/761031
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Young's modulus of nanocrystalline metal coatings is measured using the oscillating, that is, tapping, mode of a cantilever with a diamond tip. The resonant frequency of the cantilever changes when the diamond tip comes in contact with a sample surface. A Hertz-contact-based model is further developed using higher-order terms in a Taylor series expansion to determine a relationship between the reduced elastic modulus and the shift in the resonant frequency of the cantilever during elastic contact between the diamond tip and sample surface. The tapping mode technique can be used to accurately determine Young's modulus that corresponds with the crystalline orientation of the sample surface as demonstrated for nanocrystalline nickel, vanadium, and tantalum coatings.
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页数:10
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