CHARACTERIZATION OF THIN-FILMS OF Y-BA-CU-O ON OXIDIZED SILICON WITH A ZIRCONIA BUFFER LAYER

被引：50
作者：
MOGROCAMPERO, A
TURNER, LG
HALL, EL
BURRELL, MC
机构：
来源：
APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 24期
关键词：
D O I：
10.1063/1.99749
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：2068 / 2070
页数：3
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