首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
ON THE TEMPERATURE-COEFFICIENT OF THE MOSFET THRESHOLD VOLTAGE
被引:39
作者
:
KLAASSEN, FM
论文数:
0
引用数:
0
h-index:
0
KLAASSEN, FM
HES, W
论文数:
0
引用数:
0
h-index:
0
HES, W
机构
:
来源
:
SOLID-STATE ELECTRONICS
|
1986年
/ 29卷
/ 08期
关键词
:
D O I
:
10.1016/0038-1101(86)90180-2
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:787 / 789
页数:3
相关论文
共 7 条
[1]
COBBOLD RSC, THEORY APPLICATIONS
[2]
COMPENSATED MOSFET DEVICES
KLAASSEN, FM
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth
KLAASSEN, FM
HES, W
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth
HES, W
[J].
SOLID-STATE ELECTRONICS,
1985,
28
(04)
: 359
-
373
[3]
MODELING OF SCALED-DOWN MOS-TRANSISTORS
KLAASSEN, FM
论文数:
0
引用数:
0
h-index:
0
KLAASSEN, FM
DEGROOT, WCJ
论文数:
0
引用数:
0
h-index:
0
DEGROOT, WCJ
[J].
SOLID-STATE ELECTRONICS,
1980,
23
(03)
: 237
-
242
[4]
RIDEOUT VL, 1975, IBM J RES DEV, P50
[5]
THRESHOLD-VOLTAGE TEMPERATURE DRIFT IN ION-IMPLANTED MOS-TRANSISTORS
SONG, BS
论文数:
0
引用数:
0
h-index:
0
SONG, BS
GRAY, PR
论文数:
0
引用数:
0
h-index:
0
GRAY, PR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(04)
: 661
-
668
[6]
SZE SM, PHYSICS SEMICONDUCTO, P452
[7]
THE TEMPERATURE-DEPENDENCE OF THRESHOLD VOLTAGES IN SUBMICROMETER CMOS
TZOU, JJ
论文数:
0
引用数:
0
h-index:
0
TZOU, JJ
YAO, CC
论文数:
0
引用数:
0
h-index:
0
YAO, CC
CHEUNG, R
论文数:
0
引用数:
0
h-index:
0
CHEUNG, R
CHAN, H
论文数:
0
引用数:
0
h-index:
0
CHAN, H
[J].
IEEE ELECTRON DEVICE LETTERS,
1985,
6
(05)
: 250
-
252
←
1
→
共 7 条
[1]
COBBOLD RSC, THEORY APPLICATIONS
[2]
COMPENSATED MOSFET DEVICES
KLAASSEN, FM
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth
KLAASSEN, FM
HES, W
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth
HES, W
[J].
SOLID-STATE ELECTRONICS,
1985,
28
(04)
: 359
-
373
[3]
MODELING OF SCALED-DOWN MOS-TRANSISTORS
KLAASSEN, FM
论文数:
0
引用数:
0
h-index:
0
KLAASSEN, FM
DEGROOT, WCJ
论文数:
0
引用数:
0
h-index:
0
DEGROOT, WCJ
[J].
SOLID-STATE ELECTRONICS,
1980,
23
(03)
: 237
-
242
[4]
RIDEOUT VL, 1975, IBM J RES DEV, P50
[5]
THRESHOLD-VOLTAGE TEMPERATURE DRIFT IN ION-IMPLANTED MOS-TRANSISTORS
SONG, BS
论文数:
0
引用数:
0
h-index:
0
SONG, BS
GRAY, PR
论文数:
0
引用数:
0
h-index:
0
GRAY, PR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(04)
: 661
-
668
[6]
SZE SM, PHYSICS SEMICONDUCTO, P452
[7]
THE TEMPERATURE-DEPENDENCE OF THRESHOLD VOLTAGES IN SUBMICROMETER CMOS
TZOU, JJ
论文数:
0
引用数:
0
h-index:
0
TZOU, JJ
YAO, CC
论文数:
0
引用数:
0
h-index:
0
YAO, CC
CHEUNG, R
论文数:
0
引用数:
0
h-index:
0
CHEUNG, R
CHAN, H
论文数:
0
引用数:
0
h-index:
0
CHAN, H
[J].
IEEE ELECTRON DEVICE LETTERS,
1985,
6
(05)
: 250
-
252
←
1
→