MEASUREMENT OF HYDROXYL IONS IN THIN PASSIVE OXIDE-FILMS USING SECONDARY ION MASS-SPECTROMETRY

被引：0
作者：
MITCHELL, DF
SPROULE, GI
GRAHAM, MJ
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来源：
APPLIED SURFACE SCIENCE | 1985年 / 21卷 / 1-4期
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中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
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页码：199 / 209
页数：11
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