X-RAY ELEMENTAL ANALYSIS WITH A TEM

被引：0

作者：

ISAKOZAWA, S ^{[1
]}

SHINOHARA, M ^{[1
]}

KUBOZOE, M ^{[1
]}

机构：

[1] HITACHI LTD,NAKA WORKS,KATSUTA,IBARAKI 312,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1981年 / 30卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：234 / 235

页数：2

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