ANALYSIS OF NOISE MARGIN AND SPEED OF GAAS-MESFET DCFL USING UM-SPICE

被引:5
作者
HYUN, CH [1 ]
SHUR, MS [1 ]
PECZALSKI, A [1 ]
机构
[1] HONEYWELL INC,CTR SYST & RES,MINNEAPOLIS,MN 55440
关键词
D O I
10.1109/T-ED.1986.22689
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1421 / 1426
页数:6
相关论文
共 13 条
[1]  
BAEK J, 1985, IEEE T ELECTRON DEV, V32, P2426
[2]  
CHEN TH, 1985, IEEE T ELECTRON DEVI, V32
[3]  
CHEN TH, 1985, IEEE T ELECTRON DEV, V12, P883
[4]  
Hill C. F., 1968, MICROELECTRONICS, V1, P16
[5]   A SPICE MODELING TECHNIQUE FOR GAAS-MESFET ICS [J].
HUANG, CI ;
THORBJORNSEN, AR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (05) :996-998
[6]   SIMULATION AND DESIGN ANALYSIS OF (ALGA)AS/GAAS MODFET INTEGRATED-CIRCUITS [J].
HYUN, CH ;
SHUR, MS ;
CIRILLO, NC .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1986, 5 (02) :284-292
[7]   LOW FIELD MOBILITY IN GAAS ION-IMPLANTED FETS [J].
LEE, K ;
SHUR, MS ;
LEE, K ;
VU, TT ;
ROBERTS, PCT ;
HELIX, MJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (03) :390-393
[8]   WORST-CASE STATIC NOISE MARGIN CRITERIA FOR LOGIC-CIRCUITS AND THEIR MATHEMATICAL EQUIVALENCE [J].
LOHSTROH, J ;
SEEVINCK, E ;
DEGROOT, J .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1983, 18 (06) :803-807
[9]   DESIGN ANALYSIS OF GAAS DIRECT-COUPLED FIELD-EFFECT TRANSISTOR LOGIC [J].
PECZALSKI, A ;
SHUR, MS ;
HYUN, CH ;
LEE, KW ;
VU, TT .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1986, 5 (02) :266-273
[10]   HIGH-SPEED LOGIC AT 300-K WITH SELF-ALIGNED SUBMICROMETER-GATE GAAS-MESFETS [J].
SADLER, RA ;
EASTMAN, LF .
IEEE ELECTRON DEVICE LETTERS, 1983, 4 (07) :215-217