AUTOMATED PHASE-MEASURING PROFILOMETRY OF 3-D DIFFUSE OBJECTS

被引：997

作者：

SRINIVASAN, V ^{[1
]}

LIU, HC ^{[1
]}

HALIOUA, M ^{[1
]}

机构：

[1] NYCOM, OLD WESTBURY, NY 11568 USA

来源：

APPLIED OPTICS | 1984年 / 23卷 / 18期

关键词：

D O I：

10.1364/AO.23.003105

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3105 / 3108

页数：4

共 11 条

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