CERAMIC SECONDARY-ELECTRON MULTIPLIERS

被引：0
|
作者：
WAKINO, K [1 ]
FUJIKAWA, N [1 ]
EHARA, S [1 ]
YAMAMOTO, H [1 ]
机构：
[1] MURATA MFG CO, KYOTO, JAPAN
来源：
AMERICAN CERAMIC SOCIETY BULLETIN | 1974年 / 53卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：347 / 347
页数：1
相关论文
共 50 条
  • [1] SECONDARY-ELECTRON EMISSION MULTIPLIERS AS PARTICLE DETECTORS
    BAUMGARTNER, WE
    HUBER, WK
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (05): : 321 - 330
  • [2] APPLICATION OF SECONDARY-ELECTRON CHANNEL MULTIPLIERS TO SCANNING ELECTRON MICROSCOPY
    HUGHES, KA
    SULWAY, DV
    WAYTE, RC
    THORNTON, PR
    JOURNAL OF APPLIED PHYSICS, 1967, 38 (12) : 4922 - &
  • [3] PECULIARITIES OF CLUSTER ION REGISTRATION BY SECONDARY-ELECTRON MULTIPLIERS
    VOSTRIKOV, AA
    PREDTECHENSKII, MR
    ZHURNAL TEKHNICHESKOI FIZIKI, 1986, 56 (04): : 747 - 749
  • [4] Study of photocurrent in secondary-electron multipliers in atomic beam tubes
    M. S. Domanov
    Z. K. Ippolitova
    M. P. Leshchenko
    N. P. Romanova
    V. I. Turinov
    Journal of Communications Technology and Electronics, 2016, 61 : 518 - 531
  • [5] PECULARITIES OF SECONDARY-ELECTRON MULTIPLYING MECHANISM IN OPEN MICROCHANNEL MULTIPLIERS
    VOLKOV, GI
    GRINGAUZ, KI
    ZAIDEL, IN
    PEREVODCHIKOVA, GI
    DENSHCHIKOVA, LI
    KOPYLOV, VF
    SHYUTTE, NM
    SMIRNOVA, LP
    RADIOTEKHNIKA I ELEKTRONIKA, 1976, 21 (08): : 1715 - 1719
  • [6] Study of photocurrent in secondary-electron multipliers in atomic beam tubes
    Domanov, M. S.
    Ippolitova, Z. K.
    Leshchenko, M. P.
    Romanova, N. P.
    Turinov, V. I.
    JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS, 2016, 61 (05) : 518 - 531
  • [7] DEPENDENCE OF COUNTING CHARACTERISTICS OF SECONDARY-ELECTRON MULTIPLIERS ON RESIDUAL GAS PRESSURE.
    Barkovskii, V.N.
    Vydrik, A.A.
    Korobkov, I.N.
    Mikutskii, V.G.
    Instruments and Experimental Techniques (English Translation of Pribory I Tekhnika Eksperimenta), 1979, 22 (5 pt 2): : 1379 - 1381
  • [8] DEPENDENCE OF COUNTING CHARACTERISTICS OF SECONDARY-ELECTRON MULTIPLIERS ON RESIDUAL-GAS PRESSURE
    BARKOVSKII, VN
    VYDRIK, AA
    KOROBKOV, IN
    MIKUTSKII, VG
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1979, 22 (05) : 1379 - 1381
  • [9] COMPUTATION ON SECONDARY-ELECTRON EMISSION STATISTICS AND ITS APPLICATION TO SINGLE ELECTRON-SPECTRA IN PHOTOMULTIPLIERS AND ELECTRON MULTIPLIERS
    CAFOLLA, AA
    CARTER, JN
    DELANEY, CFG
    MCDONALD, IR
    NUCLEAR INSTRUMENTS & METHODS, 1975, 128 (01): : 157 - 161
  • [10] SECONDARY-ELECTRON EMISSION
    SHROFF, AM
    TONNERRE, JC
    1989 INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST, 1989, : 375 - 378
12345