THEORY OF DEFECTS IN VITREOUS SILICON DIOXIDE

被引:379
作者
OREILLY, EP
ROBERTSON, J
机构
[1] UNIV ILLINOIS,DEPT PHYS,URBANA,IL 61801
[2] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
[3] CENT ELECT RES LABS,LEATHERHEAD KT22 7SE,SURREY,ENGLAND
来源
PHYSICAL REVIEW B | 1983年 / 27卷 / 06期
关键词
D O I
10.1103/PhysRevB.27.3780
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:3780 / 3795
页数:16
相关论文
共 72 条
[1]   STRUCTURE OF VITREOUS-SILICA - VALIDITY OF RANDOM NETWORK THEORY [J].
BELL, RJ ;
DEAN, P .
PHILOSOPHICAL MAGAZINE, 1972, 25 (06) :1381-&
[2]   AB-INITIO STUDIES OF INTEROXYGEN BONDING IN O2, HO2, H2O2, O3, HO3, AND H2O3 [J].
BLINT, RJ ;
NEWTON, MD .
JOURNAL OF CHEMICAL PHYSICS, 1973, 59 (12) :6220-6228
[3]   CHEMICAL PSEUDOPOTENTIAL APPROACH TO COVALENT BONDING .1. [J].
BULLETT, DW .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1975, 8 (17) :2695-2706
[4]  
CHADI DJ, 1978, PHYSICS SIO2 ITS INT, P55
[5]   ELECTRON-STATES IN ALPHA-QUARTZ - SELF-CONSISTENT PSEUDOPOTENTIAL CALCULATION [J].
CHELIKOWSKY, JR ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1977, 15 (08) :4020-4029
[6]   BND EDGE OF AMORPHOUS SIO2 BY PHOTOINJECTION AND PHOTOCONDUCTIVITY MEASUREMENTS [J].
DISTEFANO, TH ;
EASTMAN, DE .
SOLID STATE COMMUNICATIONS, 1971, 9 (24) :2259-+
[7]   PHOTOEMISSION MEASUREMENTS OF VALENCE LEVELS OF AMORPHOUS SIO2 [J].
DISTEFANO, TH ;
EASTMAN, DE .
PHYSICAL REVIEW LETTERS, 1971, 27 (23) :1560-+
[8]  
DISTEFANO TH, 1978, PHYSICS SIO2 ITS INT, P382
[9]  
FIEGL FJ, 1974, SOLID STATE COMMUN, V14, P225
[10]  
FISHER B, 1977, PHYS REV B, V15, P3193