DIFFERENTIAL SPUTTERING CORRECTION FOR ION MICROSCOPY WITH IMAGE DEPTH PROFILING

被引：29

作者：

PATKIN, AJ ^{[1
]}

CHANDRA, S ^{[1
]}

MORRISON, GH ^{[1
]}

机构：

[1] CORNELL UNIV, DEPT CHEM, BAKER LAB CHEM, ITHACA, NY 14853 USA

来源：

ANALYTICAL CHEMISTRY | 1982年 / 54卷 / 14期

关键词：

D O I：

10.1021/ac00251a023

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：2507 / 2510

页数：4

共 19 条

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