TEMPERATURE AS A BIFURCATION PARAMETER IN NONLINEAR ELECTRONIC-CIRCUITS

被引:4
|
作者
BALBERG, I
ARBELL, H
机构
[1] Racah Institute of Physics, Hebrew University
来源
PHYSICAL REVIEW E | 1994年 / 49卷 / 01期
关键词
D O I
10.1103/PhysRevE.49.110
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
It is shown that temperature variations can bring about a series of bifurcations in the behavior of a nonlinear electronic circuit. For the semiconductor diode used in the experiments the increase of temperature above room temperature yields the period-doubling route to chaos, periodic windows, and a return to the ordered state. The most striking finding is that over the temperature range which is of general interest (i.e., just above room temperature) the temperature behaves as a genuine external control parameter of the system. We explain our observations by suggesting that the temperature is a scaling parameter of the applied voltage.
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页码:110 / 113
页数:4
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