CORRECTION OF APERTURE ABERRATION OF A PROBE-FORMING QUADRUPOLE TRIPLET

被引：0

作者：

OKAYAMA, S ^{[1
]}

机构：

[1] ELECTROTECH LAB,SAKURA,IBARAKI 305,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1991年 / 40卷 / 04期

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D O I：

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中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：256 / 256

页数：1

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