CORRECTION OF APERTURE ABERRATION OF A PROBE-FORMING QUADRUPOLE TRIPLET

被引：0
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作者：
OKAYAMA, S [1 ]
机构：
[1] ELECTROTECH LAB,SAKURA,IBARAKI 305,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1991年 / 40卷 / 04期
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中图分类号：
TH742 [显微镜];
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页码：256 / 256
页数：1
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