A NEW TECHNIQUE FOR MEASURING TEMPORAL PROFILES OF PICOSECOND AND FEMTOSECOND LASER-PULSES USING SELF-INDUCED DEFLECTION IN A SEMICONDUCTOR WEDGE

被引：0

作者：

MA, RL ^{[1
]}

YU, PY ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DIV MAT & MOLEC RES,BERKELEY,CA 94720

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1985年 / 90卷 / 01期

关键词：

D O I：

10.1002/pssa.2210900135

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：343 / 348

页数：6

共 9 条

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