A MAGNETIC FORCE MICROSCOPE USING AN OPTICAL-LEVER SENSOR AND ITS APPLICATION TO LONGITUDINAL RECORDING MEDIA

被引：10

作者：

HONDA, Y ^{[1
]}

HOSAKA, S ^{[1
]}

KIKUGAWA, A ^{[1
]}

TANAKA, S ^{[1
]}

MATSUDA, Y ^{[1
]}

SUZUKI, M ^{[1
]}

FUTAMOTO, M ^{[1
]}

机构：

[1] HITACHI LTD, MECH ENGN RES LAB, TSUCHIURA, IBARAKI 300, JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1992年 / 31卷 / 8A期

关键词：

MAGNETIC FORCE MICROSCOPE; OPTICAL LEVER SENSOR; LONGITUDINAL RECORDING MEDIUM;

D O I：

10.1143/JJAP.31.L1061

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A magnetic force microscope (MFM) is developed, which is capable of operation in both DC and AC detection modes, to allow observation of topographic and magnetic structures in the same sample area. An optical lever sensor is introduced to measure the cantilever displacement. DC detection senses the repulsive atomic force between the tip and a sample to provide surface topography information. AC detection senses the force gradient acting on an oscillating tip in the stray magnetic field emanating from the sample to provide magnetic information. A fabrication method for a sharp magnetic tips is also described. A comparison of the magnetization and surface structure images of a thin film medium observed by the MFM shows that nanometer-level roughness on the medium surface can affect the magnetic recording process.

引用

页码：L1061 / L1064

页数：4

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