SECONDARY ION MASS-SPECTROMETRY AND ELECTRON-STIMULATED DESORPTION AS PROBES OF COVALENTLY MODIFIED TIO2 AND SIO2 SURFACES

被引：6

作者：

HAYES, TR ^{[1
]}

EVANS, JF ^{[1
]}

机构：

[1] UNIV MINNESOTA,DEPT CHEM,MINNEAPOLIS,MN 55455

来源：

JOURNAL OF PHYSICAL CHEMISTRY | 1984年 / 88卷 / 10期

关键词：

D O I：

10.1021/j150654a010

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：1963 / 1973

页数：11

共 55 条

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[2] DETECTION, IDENTIFICATION AND STRUCTURAL INVESTIGATION OF BIOLOGICALLY IMPORTANT COMPOUNDS BY SECONDARY ION MASS-SPECTROMETRY
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[J]. SURFACE AND INTERFACE ANALYSIS, 1982, 4 (04) : 151 - 155
[8] SIMS STUDIES OF ADSORBATE STRUCTURE .1. CO ADSORPTION ON RU(001), NI(111) AND NI(100)
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[9] STOICHIOMETRY AND KINETICS OF THE REACTION OF SILICA WITH ORGANO-SILICON COMPOUNDS
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[10] CHARACTERIZATION OF POLYMERIC THIN-FILMS BY LOW-DAMAGE SECONDARY ION MASS-SPECTROMETRY
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