SECONDARY ION EMISSION FROM UHV-DEPOSITED AMINO-ACID OVERLAYERS ON METALS

被引：59

作者：

LANGE, W

JIRIKOWSKY, M

BENNINGHOVEN, A

机构：

来源：

SURFACE SCIENCE | 1984年 / 136卷 / 2-3期

关键词：

D O I：

10.1016/0039-6028(84)90621-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：419 / 436

页数：18

共 27 条

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[5] SECONDARY ION MASS-SPECTROMETRY - NEW ANALYTICAL TECHNIQUE FOR BIOLOGICALLY IMPORTANT COMPOUNDS
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[J]. PHYSICA STATUS SOLIDI, 1969, 34 (02): : K169 - +
[7] EMISSION OF NEGATIVE SECONDARY IONS FROM COMPOUNDS WITH ANION COMPLEXES
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[J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1969, A 24 (05): : 859 - +
[8] BENNINGHOVEN A, 1982, SURF SCI, V114, pL62, DOI 10.1016/0039-6028(82)90690-2
[9] INVESTIGATION OF SURFACE-REACTIONS BY SIMS AND TDMS - INTERACTION OF ETHYLENE AND ACETYLENE WITH HYDROGEN ON POLYCRYSTALLINE NICKEL
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[J]. APPLIED SURFACE SCIENCE, 1980, 6 (3-4) : 288 - 296
[10] BENNINGHOVEN A, 1982, SURF SCI, V123, pL721, DOI 10.1016/0039-6028(82)90122-4

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