ON THE USE OF THE NUMERICAL-SIMULATION OF THE FIRST POSITIVE SYSTEM OF N-2 .2. FAST T-ROT ESTIMATION FROM THE PARTIALLY RESOLVED (3,0)-BAND

被引：0

作者：

SIMEK, M ^{[1
]}

DEBENEDICTIS, S ^{[1
]}

机构：

[1] ACAD SCI CZECH REPUBL,INST PLASMA PHYS,CR-18211 PRAGUE 8,CZECH REPUBLIC

来源：

PLASMA CHEMISTRY AND PLASMA PROCESSING | 1995年 / 15卷 / 03期

关键词：

N-2(B); EMISSION SPECTROSCOPY; SPECTRUM SIMULATION; ROTATIONAL TEMPERATURE;

D O I：

暂无

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

A fast and simple method for estimating the rotational temperature from the partially resolved (3, 0) hand of the first positive system of N-2 (B-3 Pi(g)-A(3) Sigma(u)(+)) has been developed by numerical simulation of the (3, 0) band profile, polynomial linear least-square fitting, and polynomial interpolation. The sensitivity of the proposed method is based on the temperature dependence of the relative population of the \3 Pi(Omega)] substates. Simple polynomial formulas allow calculation of the rotational temperature in the rang of 200-1500 K from the (3, 0) band profile after reading the subband head peak values. This method has been tested on the experimental (3, 0) band emission recorded in N-2 pulsed rf discharges.

引用

页码：451 / 463

页数：13

共 20 条

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