HEXAGONAL GERMANIUM AND HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引:0
作者
PARSONS, JR
HOELKE, CW
机构
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1984年 / 50卷 / 03期
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:329 / 337
页数:9
相关论文
共 50 条
[41]   NEW TECHNIQUE IN HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].
MIHAMA, K .
JOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (01) :57-57
[42]   THE DEVELOPMENT OF INSITU HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].
SINCLAIR, R ;
YAMASHITA, T ;
PARKER, MA ;
KIM, KB ;
HOLLOWAY, K ;
SCHWARTZMAN, AF .
ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 :965-975
[43]   HIGH-RESOLUTION ELECTRON-MICROSCOPY OF POLYDIACETYLENE CRYSTALS [J].
BEBBINGTON, EMO ;
YOUNG, RJ .
INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93) :335-336
[44]   HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF BELITE [J].
WANG, YG ;
ZOU, BS ;
KUO, KH ;
FENG, XJ ;
WANG, L ;
LONG, SZ .
JOURNAL OF MATERIALS SCIENCE, 1989, 24 (03) :877-880
[45]   HIGH-RESOLUTION ELECTRON-MICROSCOPY IN POLYMERIC MATERIALS [J].
ISODA, S ;
TSUJI, M ;
KAWAGUCHI, K ;
KATAYAMA, K .
JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (02) :99-99
[46]   PROBLEMS OF INTERPRETATION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].
HOWIE, A .
JOURNAL OF MICROSCOPY-OXFORD, 1983, 129 (MAR) :239-251
[47]   POSSIBLE TRANSMITTING ELECTRON-MICROSCOPY OF HIGH-RESOLUTION [J].
VERTSNER, VN ;
VOROBEV, YV ;
VORONIN, YM ;
ZHUKOV, VA .
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1974, 38 (11) :2243-2258
[48]   HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SILICON CERAMICS [J].
CLARKE, DR .
AMERICAN CERAMIC SOCIETY BULLETIN, 1977, 56 (03) :295-295
[49]   HIGH-RESOLUTION ELECTRON-MICROSCOPY OF (SN)X [J].
KAWAGUCHI, A ;
ISODA, S ;
PETERMANN, J ;
KATAYAMA, K .
COLLOID AND POLYMER SCIENCE, 1984, 262 (06) :429-434
[50]   SYMMETRIES OF THE HIGH-RESOLUTION ELECTRON-MICROSCOPY IMAGE [J].
PORTIER, R ;
GRATIAS, D .
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1981, 6 (05) :A21-A21