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HEXAGONAL GERMANIUM AND HIGH-RESOLUTION ELECTRON-MICROSCOPY
被引:0
|
作者
:
PARSONS, JR
论文数:
0
引用数:
0
h-index:
0
PARSONS, JR
HOELKE, CW
论文数:
0
引用数:
0
h-index:
0
HOELKE, CW
机构
:
来源
:
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES
|
1984年
/ 50卷
/ 03期
关键词
:
D O I
:
暂无
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:329 / 337
页数:9
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