TUNNELING CURRENT MICROSCOPY

[1] BOTTOMS WR, 1975, SOLID STATE SCI, V5, P297

[2] Ehrenberg W., 1981, ELECTRON BOMBARDMENT

[3] KUSHNER RA, COMMUNICATION

[4] CHARGE COLLECTION SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : R51 - R80

[5] FOWLER-NORDHEIM TUNNELING INTO THERMALLY GROWN SIO2 [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (01) : 278 - +

[6] LIN PSD, UNPUB J ELECTROCHEM

[7] REFLECTION AND TRANSMISSION SECONDARY EMISSION FROM SILICON [J]. APPLIED PHYSICS LETTERS, 1970, 17 (08) : 313 - &

[8] ROITMAN P, 1977, THESIS PRINCETON U

[9] ROITMAN PR, 1977, 1977 P SCANN EL MICR, V11, P731

[1] BOTTOMS WR, 1975, SOLID STATE SCI, V5, P297

[2] Ehrenberg W., 1981, ELECTRON BOMBARDMENT

[3] KUSHNER RA, COMMUNICATION

[4] CHARGE COLLECTION SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : R51 - R80

[5] FOWLER-NORDHEIM TUNNELING INTO THERMALLY GROWN SIO2 [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (01) : 278 - +

[6] LIN PSD, UNPUB J ELECTROCHEM

[7] REFLECTION AND TRANSMISSION SECONDARY EMISSION FROM SILICON [J]. APPLIED PHYSICS LETTERS, 1970, 17 (08) : 313 - &

[8] ROITMAN P, 1977, THESIS PRINCETON U

[9] ROITMAN PR, 1977, 1977 P SCANN EL MICR, V11, P731