MICROHARDNESS OF BI12SIO20, BI12TIO20, AND BI12GEO20 MONOCRYSTALS

被引：1

作者：

PAMUKCHIEVA, VD

TRIFONOVA, EP

HITOVA, L

HADJIISKI, A

机构：

[1] UNIV SOFIA,DEPT PHYS,BU-1126 SOFIA,BULGARIA

[2] UNIV SOFIA,INST SEMICOND PHYS & TECHNOL,BU-1126 SOFIA,BULGARIA

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 1993年 / 28卷 / 01期

关键词：

D O I：

10.1002/crat.2170280120

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The microhardness, H, of Sillenite-type monocrystals of undoped Bi12SiO20, Bi12TiO20, Bi12GeO20 and Cr-, Fc-, Mn- doped Bi12SiO20 has been investigated. The dependences of H on the surface treatment, dopants and orientation of the materials have been established. It was found that the H and dislocation density, N(d), distribution along the diameter of the sample for undoped (100)-Bi12SiO20 are of M- and W-shape, respectively.

引用

页码：119 / 123

页数：5

共 50 条

[31] Analysis of the core in Bi12SiO20 and Bi12GeO20 crystals grown by the Czochralski method [J].

Santos, MT ;

Arizmendi, L ;

Bravo, D ;

Dieguez, E .

MATERIALS RESEARCH BULLETIN, 1996, 31 (04) :389-396

[32] LIGHT-INDUCED FIELD REDISTRIBUTION IN SILLENITES BI12SIO20, BI12GEO20 [J].

GUDAEV, OA ;

GUSEV, VA ;

PAUL, EE .

FIZIKA TVERDOGO TELA, 1986, 28 (04) :1110-1114

[33] PHOTOREFRACTIVE EFFECT IN BISMUTH SILICONE (OR GERMANIUM) OXIDE BI12SIO20 (BI12GEO20) [J].

ROOSEN, G ;

LESAUX, G ;

PAULIAT, G ;

ALLAIN, M ;

JONATHAN, JMC ;

BRUN, A .

REVUE DE PHYSIQUE APPLIQUEE, 1987, 22 (10) :1253-1267

[34] INFRARED-SPECTRA OF THIN-FILMS OF BI12GEO20 AND BI12SIO20 [J].

WOJDOWSKI, W .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1984, 123 (02) :K101-K104

[35] INTERNAL-FRICTION IN BI12GEO20 AND BI12SIO20 ASSOCIATED WITH ELECTRONIC STATE [J].

VOLNYANSKII, MD ;

KUDZIN, AY ;

CHERTKOV, IL .

FIZIKA TVERDOGO TELA, 1987, 29 (01) :228-230

[36] RAMAN-SCATTERING IN BI12SIO20 AND BI12GEO20 SINGLE-CRYSTALS [J].

BABONAS, GA ;

ZARETSKY, YG ;

KURBATOV, GA ;

UKHANOV, YI ;

SHMARTSEV, YV .

OPTIKA I SPEKTROSKOPIYA, 1982, 53 (02) :358-361

[37] Bright spatial soliton in photorefractive planar Bi12TiO20/Bi12SiO20 waveguide [J].

Frolova, M ;

Borodin, M ;

Shandarov, S ;

Shandarov, V ;

Egorysheva, A ;

Kargin, Y ;

Volkov, V ;

Kip, D .

LFNM 2003: LASER AND FIBER-OPTICAL NETWORKS MODELING, PROCEEDINGS, 2003, :142-144

[38] Impurity defects in Cr-doped Bi12SiO20 and Bi12TiO20 crystals [J].

A. A. Nechitailov ;

M. V. Krasin’kova ;

E. V. Mokrushina ;

A. A. Petrov ;

N. F. Kartenko ;

V. V. Prokof’ev .

Inorganic Materials, 2000, 36 :820-825

[39] Impurity defects in Cr-doped Bi12SiO20 and Bi12TiO20 crystals [J].

Nechitailov, AA ;

Krasin'kova, MV ;

Mokrushina, EV ;

Petrov, AA ;

Kartenko, NF ;

Prokof'ev, VV .

INORGANIC MATERIALS, 2000, 36 (08) :820-825

[40] CRYSTAL CHIRALITY AND OPTICAL-ROTATION SENSE IN ISOMORPHOUS BI12SIO20 AND BI12GEO20 [J].

ABRAHAMS, SC ;

SVENSSON, C ;

TANGUAY, AR .

SOLID STATE COMMUNICATIONS, 1979, 30 (05) :293-295

← 1 2 3 4 5 →