MICROHARDNESS OF BI12SIO20, BI12TIO20, AND BI12GEO20 MONOCRYSTALS

被引：1

作者：

PAMUKCHIEVA, VD

TRIFONOVA, EP

HITOVA, L

HADJIISKI, A

机构：

[1] UNIV SOFIA,DEPT PHYS,BU-1126 SOFIA,BULGARIA

[2] UNIV SOFIA,INST SEMICOND PHYS & TECHNOL,BU-1126 SOFIA,BULGARIA

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 1993年 / 28卷 / 01期

关键词：

D O I：

10.1002/crat.2170280120

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The microhardness, H, of Sillenite-type monocrystals of undoped Bi12SiO20, Bi12TiO20, Bi12GeO20 and Cr-, Fc-, Mn- doped Bi12SiO20 has been investigated. The dependences of H on the surface treatment, dopants and orientation of the materials have been established. It was found that the H and dislocation density, N(d), distribution along the diameter of the sample for undoped (100)-Bi12SiO20 are of M- and W-shape, respectively.

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页码：119 / 123

页数：5

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