共 43 条
[1]
FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS
[J].
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES,
1981, 43 (02)
:325-335
[3]
BENTLEY J, 1980, 38TH P ANN M EL MICR, P72
[4]
Boersch H, 1936, ANN PHYS-BERLIN, V27, P75
[5]
BROWN LM, 1976, SCANNING ELECTRON MI, V1, P353
[6]
3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
[J].
ACTA CRYSTALLOGRAPHICA SECTION A,
1982, 38 (JAN)
:55-&
[7]
CARPENTER RW, 1980, 15TH P ANN C MICR AN, V1
[8]
CARPENTER RW, 1982, 40TH P ANN M EMSA, P696
[9]
CHAN IYT, 1981, P VAIL WORKSHOP, P107
[10]
CONDENSER APERTURE MISALIGNMENT AND SOLUTE PROFILE ASYMMETRIES IN STEM X-RAY-MICROANALYSIS
[J].
JOURNAL OF MICROSCOPY-OXFORD,
1983, 130 (MAY)
:RP3-RP4