DIFFUSIVITY OF IMPLANTED CHLORINE ATOMS IN THERMAL OXIDES ON SILICON

被引:3
作者
VENGURLEKAR, AS [1 ]
RAMANATHAN, KV [1 ]
KARULKAR, VT [1 ]
SALVI, VP [1 ]
机构
[1] UNIV BOMBAY,DEPT PHYS,BOMBAY 400098,INDIA
关键词
D O I
10.1149/1.2114053
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
20
引用
收藏
页码:1172 / 1177
页数:6
相关论文
共 21 条
  • [1] ANTONIADIS DA, 1978, 50192 STANF U STANF
  • [2] MOS CAPACITANCE VOLTAGE CHARACTERISTICS AND DIELECTRIC-PROPERTIES OF ION-IMPLANTED THERMAL OXIDES ON SILICON
    CHANDORKAR, A
    KARULKAR, VT
    VENGURLEKAR, AS
    RAMANATHAN, KV
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 81 (01): : 407 - 414
  • [3] Chu WK., 1978, BACKSCATTERING SPECT
  • [4] GREEUW G, 1982, INSULATING FILMS SEM, P203
  • [5] ROLE OF HCL IN PASSIVATION OF MOS STRUCTURES
    KRIEGLER, RJ
    [J]. THIN SOLID FILMS, 1972, 13 (01) : 11 - &
  • [6] RESIDUAL CHLORINE IN O2-HCL GROWN SIO2
    MEEK, RL
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (02) : 308 - 310
  • [7] PHASE-SEPARATION AND SODIUM PASSIVATION IN SILICON-OXIDES GROWN IN HCI-O2 AMBIENTS
    MONKOWSKI, J
    STACH, J
    TRESSLER, RE
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (07) : 1129 - 1134
  • [8] MONKOWSKI J, 1979, SOLID STATE TECHNOL, V22, P113
  • [9] MONKOWSKI J, 1979, SOLID STATE TECHNOL, V22, P58
  • [10] ROHATAGI A, 1971, APPL PHYS LETT, V30, P104