QUANTITATIVE DETECTION OF ALPHA-PARTICLES IN CERTAIN DIELECTRIC MATERIALS

被引：0

作者：

RICKARD, IC ^{[1
]}

BESANT, CB ^{[1
]}

LYKOS, T ^{[1
]}

TRUCH, ER ^{[1
]}

机构：

[1] IMPERIAL COLL SCI & TECHNOL,LONDON SW7,ENGLAND

来源：

MICROSCOPE | 1974年 / 22卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：141 / 149

页数：9

共 9 条

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[8] CHEMICAL ETCHING OF CHARGED-PARTICLE TRACKS IN SOLIDS [J].

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[9] EXAMINATION OF FISSION FRAGMENT TRACKS WITH AN ELECTRON MICROSCOPE [J].

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